The Free On-line Dictionary of Computing (30 December 2018):

scan design
Scan-In, Scan-Out

    (Or "Scan-In, Scan-Out") A electronic circuit
   design technique which aims to increase the controllability
   and observability of a digital logic circuit by
   incorporating special "scan registers" into the circuit so
   that they form a scan path.

   Some of the more common types of scan design include the
   multiplexed register designs and level-sensitive scan
   design (LSSD) used extensively by IBM.  Boundary scan can
   be used alone or in combination with either of the above
   techniques.

   ["Digital Systems Testing and Testable Design" by Abramovici,
   Breuer, and Friedman, ISBN 0-7167-8179-4].

   ["Design of Testable Logic Circuits" by R.G. Bennetts,
   (Brunel/Southhampton Universities), ISBN 0-201-14403-4].

   (1995-02-23)